skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Orientation-dependent critical currents in Y sub 1 Ba sub 2 Cu sub 3 O sub 7 minus x epitaxial thin films: Evidence for intrinsic flux pinning

Conference · · AIP Conference Proceedings (American Institute of Physics); (United States)
OSTI ID:5101255
; ; ; ; ; ; ; ;  [1];  [2]
  1. Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)
  2. IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598-0218 (United States)

For YBCO epitaxial thin films the basal plane transport critical current density {ital J}{sub {ital c}}, flowing perpendicular to an applied magnetic field {ital H}, depends sensitively on the orientation of the crystal with respect to H. In particular, {ital J}{sub {ital c}} is sharply peaked and greatly enhanced when H is precisely parallel to the copper-oxygen planes. Experiments on a series of epitaxial monolithic and superconductor-insulator multilayer thin films provide clear evidence that the enhancement is a bulk, rather than surface or thin sample, phenomenon. Measurements of the orientation dependence are presented and compared with a model of intrinsic flux pinning'' by the layered crystal structure.

DOE Contract Number:
AC05-84OR21400
OSTI ID:
5101255
Report Number(s):
CONF-900990-; CODEN: APCPC
Journal Information:
AIP Conference Proceedings (American Institute of Physics); (United States), Vol. 219:1; Conference: 4. annual conference on superconductivity and its applications, Buffalo, NY (United States), 18-20 Sep 1990; ISSN 0094-243X
Country of Publication:
United States
Language:
English