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Title: Large, orientation-dependent enhancements of critical currents in Y sub 1 Ba sub 2 Cu sub 3 O sub 7-x epitaxial thin films: Evidence for intrinsic flux pinning

Conference ·
OSTI ID:6815501
; ; ; ; ; ; ;  [1];  [2]; ;  [3]
  1. Oak Ridge National Lab., TN (USA)
  2. Oak Ridge National Lab., TN (USA) Tennessee Univ., Knoxville, TN (USA)
  3. North Carolina State Univ., Raleigh, NC (USA)

The basal plane transport critical current density J{sub c} of YBCO epitaxial thin films is strongly anisotropic, leading to large enhancements of J{sub c} when H is precisely parallel to the copper-oxygen planes. Experimental evidence shows that the enhancement is a bulk phenomenon, and the orientation dependence is compared with a model of intrinsic flux pinning'' by the layered crystal structure. 7 refs., 2 figs.

Research Organization:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
DOE/ER
DOE Contract Number:
AC05-84OR21400
OSTI ID:
6815501
Report Number(s):
CONF-900806-5; ON: DE90009424
Resource Relation:
Conference: 19. international conference on low temperature physics, Brighton (UK), 16-22 Aug 1990
Country of Publication:
United States
Language:
English