Soft-error susceptibility of a CMOS RAM: dependence upon power-supply voltage
Two types of delidded CMOS 1024 x 1 RAM (Harris HM 6508-RH and Sandia TA597) have been tested for susceptibility to soft bit errors caused by 150-MeV krypton ions. Bit-error susceptibility was measured as a function of bias voltage and exposure angle with respect to the chip normal. Comparison of measured bit-error rates and thresholds with those computed by use of a simple device model and manufacturer-supplied data shows good agreement in some respects while raising questions in others. In the case of the HM6508-RH RAMs, measured values of critical charge of 1 pC and 2 pC at 5V and 7V, respectively, indicate that the devices can be expected to show bit-error rates in space of approximately 1 x 10-/sup 5/ per chip per day at 7V bias.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (USA); Aerospace Corp., Los Angeles, CA (USA). Space Sciences Lab.; Auburn Univ., AL (USA). Dept. of Electrical Engineering
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 5079164
- Report Number(s):
- SAND-81-2140; ON: DE82015654
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
420800 -- Engineering-- Electronic Circuits & Devices-- (-1989)
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGED PARTICLES
ELECTRONIC CIRCUITS
ENERGY RANGE
ERRORS
INTEGRATED CIRCUITS
IONS
KRYPTON IONS
MEMORY DEVICES
MEV RANGE
MEV RANGE 100-1000
MICROELECTRONIC CIRCUITS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR STORAGE DEVICES
420800 -- Engineering-- Electronic Circuits & Devices-- (-1989)
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGED PARTICLES
ELECTRONIC CIRCUITS
ENERGY RANGE
ERRORS
INTEGRATED CIRCUITS
IONS
KRYPTON IONS
MEMORY DEVICES
MEV RANGE
MEV RANGE 100-1000
MICROELECTRONIC CIRCUITS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR STORAGE DEVICES