Radiation hardness of CMOS LSI circuits
Conference
·
· IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:6545746
Microprocessors and their associated support chips selected from commercially available types are being investigated for use in applications having radiation survival requirements. The radiation responses of advanced technology CMOS LSI devices were assessed in this study. The microprocessors tested were the RCA COSMAC CDP 1802 CD and preproduction samples of the RCA TCS 074 General Processor Unit. The memory devices tested were the Intersil 6508 and 6508A, Harris 6508-8 and RCA MWS 5001D 1K RAMs, and Intersil 6312 12K ROM. The I/0 device tested was the Intersil 6402 UART.
- Research Organization:
- Boeing Aerospace Co., Seattle, WA
- OSTI ID:
- 6545746
- Conference Information:
- Journal Name: IEEE Trans. Nucl. Sci.; (United States) Journal Volume: NS-24:6
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360206 -- Ceramics
Cermets
& Refractories-- Radiation Effects
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ELECTRONIC CIRCUITS
HARDENING
INTEGRATED CIRCUITS
MICROELECTRONIC CIRCUITS
MICROPROCESSORS
MOS TRANSISTORS
PERFORMANCE TESTING
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
SEMICONDUCTOR DEVICES
TESTING
TRANSISTORS
360206 -- Ceramics
Cermets
& Refractories-- Radiation Effects
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ELECTRONIC CIRCUITS
HARDENING
INTEGRATED CIRCUITS
MICROELECTRONIC CIRCUITS
MICROPROCESSORS
MOS TRANSISTORS
PERFORMANCE TESTING
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
SEMICONDUCTOR DEVICES
TESTING
TRANSISTORS