IMPROVEMENTS IN OR RELATING TO RADIATION THICKNESS GAUGES
Patent
·
OSTI ID:4828611
TION THICKNESS GAUGES. George Syke and William Thomas James (to Baldwin Instrument Co., Ltd.). British Patent 882,729. Nov. 15, 1961. A radiation thickness gage using a backscatter technique is designed for measuring the thickness of a film being passed between two cylinders. The gage comprises a radiation source and an ionization chamber pivotally mounted so that both can swing together between the operative position viewing a film-covered cylinder and a standardizing position viewing a bare cylinder. The geometrical relationship of the measuring head to the film during measurement is kept the same as that of the head to the bare cylinder during standardization. (D. L. C.)
- Research Organization:
- Originating Research Org. not identified
- NSA Number:
- NSA-16-003160
- OSTI ID:
- 4828611
- Report Number(s):
- GB 882729
- Country of Publication:
- United Kingdom
- Language:
- English
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