Synthesis and characterization of YBa{sub 2}Cu{sub 3}O{sub y} and LaSrGaO{sub y} thin films
Journal Article
·
· Advances in Cryogenic Engineering
OSTI ID:482077
- National Taiwan Univ., Taipei (Taiwan, Province of China); and others
The X-ray diffraction, Scanning Tunneling Microscope and Scanning Force Microscope were utilized to characterize the surface morphology and the crystal structure of YBa{sub 2}Cu{sub 3}O{sub Y} (YBCO) and LaSrGaO{sub y} (LSGO) thin films on MgO(001) and SrTiO{sub 3}(001) substrates. YBCO and LSGO films were prepared by the rf magnetron sputtering and the pulse laser ablation. The X-ray diffraction pattern shows that YBCO and LSGO films on SrTiO{sub 3}(001) and MgO(001) were epitaxial, with the crystal c-axis perpendicular to the plane of the substrate. Spiral dislocation and layer-cake-like morphology were observed in YBCO films. T{sub c} of the as grown YBCO films was about 90 K with the critical current density greater than 106 A/cm{sup 2} at 77 K.
- OSTI ID:
- 482077
- Report Number(s):
- CONF-950722--; CNN: Grant 84-2112-M002-026
- Journal Information:
- Advances in Cryogenic Engineering, Journal Name: Advances in Cryogenic Engineering Vol. 42B; ISSN 0065-2482; ISSN ACYEAC
- Country of Publication:
- United States
- Language:
- English
Similar Records
LaSrGaO sub 4 substrate gives oriented crystalline YBa sub 2 Cu sub 3 O sub 7 minus y films
Effects of metal buffer layer on the epitaxial growth of YBa{sub 2}Cu{sub 3}O{sub 7{minus}y} superconducting films by dipping-pyrolysis process
Critical current characteristics of step-edge YBa{sub 2}Cu{sub 3}O{sub y} weak lines
Journal Article
·
Sun Nov 24 23:00:00 EST 1991
· Applied Physics Letters; (United States)
·
OSTI ID:6225168
Effects of metal buffer layer on the epitaxial growth of YBa{sub 2}Cu{sub 3}O{sub 7{minus}y} superconducting films by dipping-pyrolysis process
Conference
·
Thu Oct 31 23:00:00 EST 1996
·
OSTI ID:392185
Critical current characteristics of step-edge YBa{sub 2}Cu{sub 3}O{sub y} weak lines
Journal Article
·
Sun Jun 01 00:00:00 EDT 1997
· Advances in Cryogenic Engineering
·
OSTI ID:482068