Critical current characteristics of step-edge YBa{sub 2}Cu{sub 3}O{sub y} weak lines
- National Taiwan Univ., Taipei (Taiwan, Province of China); and others
YBa{sub 2}Cu{sub 3}O{sub y} (YBCO) junctions were fabricated across the step-edge on MgO (001) substrates. The line of the step-edge made an angle, {alpha}, of 90{degrees}, 45{degrees}, or 22.5{degrees} with the crystal a-axis. The step heights were 120 - 350 nm. YBCO films were grown onto the MgO (001) (the step-edge substrate) using an off axis rf magnetron sputtering system. The YBCO films were patterned to a 10 {mu}m narrow strip crossing the edges. The critical current densities of YBCO junctions at T/T{sub c} = 0.9 varied from 10{sup 3} - 10{sup 5} A/cm{sup 2} depending on ratio of the step height to the film thickness. The I-V curves under microwave irradiation showed Shapiro steps, indicating weak-link behavior. Using the step-edge junctions, the authors fabricated and characterized junctions and SQUIDs.
- OSTI ID:
- 482068
- Report Number(s):
- CONF-950722--; CNN: Grant 84-2112-M002-020
- Journal Information:
- Advances in Cryogenic Engineering, Journal Name: Advances in Cryogenic Engineering Vol. 42B; ISSN 0065-2482; ISSN ACYEAC
- Country of Publication:
- United States
- Language:
- English
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