Electronic Sputtering of Thin Conductors by Neutralization of Slow Highly Charged Ions

Journal Article · Sat Mar 01 04:00:00 EST 1997 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.78.2481· OSTI ID:477044

Schenkel, T; Briere, M; Schneider, D H ^[1]; Schenkel, T; Schmidt-Boecking, H; Bethge, K ^[2]

---

1. Physics Space Technology Directorate, Lawrence Livermore National Laboratory, Livermore, California 94550 (United States)
2. Institut fuer Kernphysik, J.W. Goethe University, Frankfurt (Germany)

Charge states of slow (v{approx}0.3v{sub Bohr}) highly charged ions (O{sup 7+}, Ar{sup 16,18+}, Kr{sup 33+}, Th{sup 65+}) have been determined after transmission through 10nm thick amorphous carbon foils. Up to the highest charge states, ions reach charge state equilibrium in the foils within less than 21fs. High yields of secondary ions are emitted from the foils as a result of the dissipation of tens to hundreds of keV of potential energy during ion neutralization. Positive secondary carbon ion yields increase strongly for q{gt}25+. Our results demonstrate, for the first time, the occurrence of electronic sputtering in the interaction of slow ions with thin conductors. {copyright} {ital 1997} {ital The American Physical Society}

• Research Organization: Lawrence Livermore National Laboratory
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 477044
• Journal Information: Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 12 Vol. 78; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
AMORPHOUS STATE
ARGON IONS
BEAM NEUTRALIZATION
CARBON 12 TARGET
COLLISIONS
KRYPTON IONS
MULTICHARGED IONS
OXYGEN IONS
PROTONS
SECONDARY EMISSION
SPUTTERING
THORIUM IONS