A PUNCHED TAPE CONTROLLED X-RAY DIFFRACTOMETER FOR AUTOMATIC MEASUREMENT OF DIFFRACTION INTENSITIES OF SINGLE CRYSTALS
Thesis/Dissertation
·
OSTI ID:4700034
The design and performance of an x-ray diffractometer using punched tape to control the diffraction angle are described. Measurements of reflection in a reciprocal hemisphere are possible. The results of the measurements are punched on paper tape and can be used directly as input data for an electronic computer. (Gmelin Inst.)
- Research Organization:
- Originating Research Org. not identified
- NSA Number:
- NSA-17-025578
- OSTI ID:
- 4700034
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
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