THE USE OF AN ELECTRON MICROSCOPE FOR DEMONSTRATION OF LATTICE PLANES IN THIN SINGLE CRYSTALS AND FOR THE DETERMINATION OF THE LATTICE CONSTANTS USING SMALL AREA DIFFRACTION (in German)
Thesis/Dissertation
·
OSTI ID:4014746
The minimal distance of lattice planes that can be separated with an electron microscope is investigated. Methods for the determination of lattice consthnts using small area diffraction are described. Sources of errors are discussed. The design of special sample carriers with large transmission areas is described. (Gmelin Inst.)
- Research Organization:
- Originating Research Org. not identified
- NSA Number:
- NSA-18-020319
- OSTI ID:
- 4014746
- Report Number(s):
- AED-DISS. 63-287
- Country of Publication:
- Country unknown/Code not available
- Language:
- German
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