Quantitative X-ray microanalysis and thichness determination using {zeta} factor

Conference · Tue Dec 31 04:00:00 UTC 1996

OSTI ID:468875

Watanabe, M ^[1]; Horita, Z; Nemoto, M ^[2]

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1. Lehigh Univ., Bethlehem, PA (United States)
2. Kyushu Univ., Fukuoka (Japan)

X-ray absorption in quantitative x-ray microanalysis of thin specimens may be corrected without knowledge of thickness when the extrapolation method or the differential x-ray absorption (DXA) method is used. However, there is an experimental limitation involved in each method. In this study, a method is proposed to overcome such a limitation. The method is developed by introducing the {zeta} factor and by combining the extrapolation method and DXA method. The method using the {zeta} factor, which is called the {zeta}-DXA method in this study, is applied to diffusion-couple experiments in the Ni-Al system.

• OSTI ID: 468875
• Report Number(s): CONF-960877--
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION
ALUMINIUM ALLOYS
CALCULATION METHODS
DIFFUSION
INTERMETALLIC COMPOUNDS
MICROANALYSIS
NICKEL ALLOYS
PHASE STUDIES
THICKNESS
X RADIATION