Quantitative x-ray microanalysis of U-Nb alloys with the scanning transmission electron microscope
Conference
·
OSTI ID:6420257
The transmission electron microscope (TEM) and scanning transmission electron microscope (STEM) are currently being used to study phase transformations in uranium rich U-Nb alloys. To perform quantitative STEM X-ray microanalysis successfully, several problems must be solved. One problem is sample preparation since these alloys react strongly to most chemical solutions and oxidize readily in air. In addition, the high average atomic number of this material requires characterization of electron penetration, X-ray absorption, and electron beam spreading within the foil. It is the objective of this paper to describe the techniques developed to enable quantitative X-ray microanalysis on these alloys. Included are the experimental determination of the Cliff-Lorimer K/sub NbU/ factor at 100 and 200 kV and an examination of the limitations of this analysis technique, including X-ray spatial resolution and X-ray absorption, as applied to U-Nb alloys.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (USA)
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 6420257
- Report Number(s):
- SAND-81-0147C; CONF-810705-3
- Country of Publication:
- United States
- Language:
- English
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