Absorption effects in STEM microanalysis of ceramic oxides

Conference · Sat Mar 01 04:00:00 EST 1980 · J. Am. Ceram. Soc.; (United States)

OSTI ID:5407759

Bender, B A; Williams, D B; Notis, M R

A scanning transmission electron microscope (STEM) equipped with an x-ray energy dispersive spectrometer (EDS) was used for quantitative x-ray microanalysis of an MgO-10 mol% NiO ceramic. Using the Cliff-Lorimer standardless ratio technique for quantitative x-ray microanalysis, absorption of the Mg characteristic x rays, particularly by oxygen in the specimen, was found to be a critical problem and corrections were required. This problem is characteristic of low atomic number oxide ceramics. However, preferential absorption of characteristic x rays by carbon contamination buildup during x-ray analysis was negligible. A grain-boundary composition profile, corrected for absorption, showed no segregation of the Ni to the grain boundary, in agreement with current segregation theory.

• Research Organization: Lehigh Univ., Bethlehem, PA
• DOE Contract Number: EY-76-S-02-2408
• OSTI ID: 5407759
• Conference Information: Journal Name: J. Am. Ceram. Soc.; (United States) Journal Volume: 63:3-4
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
ALKALINE EARTH METAL COMPOUNDS
CARBON
CHALCOGENIDES
CRYSTAL STRUCTURE
DEPOSITION
ELECTRON MICROSCOPY
ELEMENTS
FABRICATION
GRAIN BOUNDARIES
HOT PRESSING
MAGNESIUM COMPOUNDS
MAGNESIUM OXIDES
MATERIALS WORKING
MICROSCOPY
MICROSTRUCTURE
NICKEL COMPOUNDS
NICKEL OXIDES
NONMETALS
OXIDES
OXYGEN COMPOUNDS
POLISHING
PRESSING
SEGREGATION
SORPTIVE PROPERTIES
SURFACE COATING
SURFACE FINISHING
SURFACE PROPERTIES
TRANSITION ELEMENT COMPOUNDS
TRANSMISSION ELECTRON MICROSCOPY