Application of a time-of-flight mass spectrometer to the examination of ion-molecule interactions

Journal Article · Tue Jan 01 04:00:00 EST 1963 · Advan. Mass. Spectrometry, 2: Proc. Conf. Oxford, 1961

DOI:https://doi.org/10.1016/B978-0-08-009775-6.50045-1· OSTI ID:4657368

Homer, J B; Lehrle, R S; Robb, J C; Takahasi, M; Thomas, D W

A Bendix time-of-flight mass spectrometer was modified so that the usual electron beam may be replaced by a beam of positive ions from an auxiliary source. These bombarding ions may be given any chosen energy up to 2000 ev, and enter into the field-free region of the source of the time-of-flight spectrometer, where they may interact with a sample entering through the normal gas inlet. Systems were examined in which the bombarding ion may remove an electron or abstract a hydrogen atom from the sample molecule. In the former case dissociative ionization was frequently observed. An attempt was made to relate the probability of the possible interaction processes to the internal and translational energies of the ions involved.

• Research Organization: Univ. of Birmingham, Eng.
• Sponsoring Organization: USDOE
• NSA Number: NSA-17-038989
• OSTI ID: 4657368
• Journal Information: Advan. Mass. Spectrometry, 2: Proc. Conf. Oxford, 1961, Journal Name: Advan. Mass. Spectrometry, 2: Proc. Conf. Oxford, 1961
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
ION BEAMS
MASS SPECTROMETERS
SPECTROMETERS
TIME OF FLIGHT METHOD