Characterization of thick lead zirconate titanate films fabricated using a new sol gel based process

Journal Article · Wed Jan 01 04:00:00 UTC 1997 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.364172· OSTI ID:463475

Barrow, D A ^[1]; Petroff, T E ^[1]; Tandon, R P ^[2]; Sayer, M ^[3]

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1. Datec Coating Corporation, Stirling Hall, 99 University Avenue, Kingston, Ontario K7L 3N6 (Canada)
2. National Physical Laboratory, New Delhi (India)
3. Department of Physics, Queen`s University, Kingston, Ontario K7L 3N6 (Canada)

Lead zirconate titanate (PZT) films 60 {mu}m in thickness have been fabricated using a new sol gel based process. PZT powders are dispersed in a sol gel matrix to form a 0{endash}3 ceramic/ceramic composite. The dielectric properties of these films have been studied as a function of powder concentration, frequency, and temperature. The characteristic Curie point is observed at 420{degree}C. The ferroelectric behavior measured in terms of the remanant polarization (P{sub r}=35 {mu}C/cm{sup 2}) and coercive field (E{sub c}=20 kV/cm) was an improvement over values quoted for thin PZT films but lower than that of bulk ceramic. The piezoelectric properties d{sub 33} (325 pC/N) and d{sub 31} ({minus}80 pC/N) were comparable with those of the bulk ceramic. {copyright} {ital 1997 American Institute of Physics.}

• OSTI ID: 463475
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 2 Vol. 81; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
COERCIVE FORCE
COMPOSITE MATERIALS
CURIE POINT
DIELECTRIC PROPERTIES
FABRICATION
FERROELECTRIC MATERIALS
FREQUENCY DEPENDENCE
PIEZOELECTRICITY
PZT
SOL-GEL PROCESS
TEMPERATURE DEPENDENCE
THIN FILMS