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Influence of preparation parameters on the chemical composition and structural properties of CuInSe{sub 2} thin films

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.51214· OSTI ID:451087
;  [1]
  1. Depto. de Fisica Universidad Nacional, Bogota (Colombia)
The influence of the preparation parameters on the chemical and phase composition and crystallographic orientation of CuInSe{sub 2} (CIS) thin films deposited by coevaporation of Cu, In and Se were studied by X-ray diffraction and EDS techniques. From these results, the conditions to grow CuInSe{sub 2} films in the chalcopyrite phase were determined. Based in the correlation of EDS analysis with XRD measurements, a procedure to identify the presence of Cu{sub 2{minus}{ital x}}Se in CuInSe{sub 2} films is presented in this work. {copyright} {ital 1996 American Institute of Physics.}
OSTI ID:
451087
Report Number(s):
CONF-9409431--
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 378; ISSN 0094-243X; ISSN APCPCS
Country of Publication:
United States
Language:
English

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