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SUPERCONDUCTIVITY OF NIOBIUM THIN FILMS DEPOSITED BY dc-DIODE SPUTTERING.

Journal Article · · J. Appl. Phys., 38: 4390-2(Oct. 1967).
DOI:https://doi.org/10.1063/1.1709136· OSTI ID:4501898
;
Research Organization:
Bell Telephone Labs, Inc., Murray Hill, N. J.
Sponsoring Organization:
USDOE
NSA Number:
NSA-22-001078
OSTI ID:
4501898
Journal Information:
J. Appl. Phys., 38: 4390-2(Oct. 1967)., Journal Name: J. Appl. Phys., 38: 4390-2(Oct. 1967).
Country of Publication:
Country unknown/Code not available
Language:
English

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Related Subjects

FILMS
MEASUREMENT
N32720* --Physics (Low Temperature)--Superconductivity
NIOBIUM
NIOBIUM/superconducting transition measurements in thin films of
deposited by sputtering
SPUTTERING
SUPERCONDUCTIVITY
THICKNESS