An empirical model for predicting proton induced upset
Journal Article
·
· IEEE Transactions on Nuclear Science
- Alcatel Espace, Toulouse (France)
- CNES, Toulouse (France)
- CERT/ONERA, Toulouse (France). Dept. d`Etudes et de Recherche en Technologie Spatiale
This paper presents an empirical model for proton induced Single Event Upset (SEU). This model is based on heavy ion data, and will improve the previous two parameters Bendel model. Application to various parts is presented.
- OSTI ID:
- 443054
- Report Number(s):
- CONF-960773--
- Journal Information:
- IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6 Vol. 43; ISSN 0018-9499; ISSN IETNAE
- Country of Publication:
- United States
- Language:
- English
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