Two parameter bendel model calculations for predicting proton induced upset

Conference · Sat Dec 01 04:00:00 EST 1990 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA)

OSTI ID:5767738

Stapor, W J; Langworthy, J B; Petersen, E L ^[1]; Meyers, J P ^[2]

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1. Naval Research Lab., Washington, DC (USA)
2. Sachs/Freeman Associates, Inc., Bowie, MD (USA)

The present best method of predicting proton induced SEU rates in the proton radiation belts is a semi-empirical technique and describes the upset cross section as a function of a single experimental parameter. This paper demonstrates that improved fits of both new and old data can be obtained with a two parameter approach.

• OSTI ID: 5767738
• Report Number(s): CONF-900723--
• Conference Information: Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) Journal Volume: 37:6
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BARYONS
DATA
ELEMENTARY PARTICLES
ENERGY DEPENDENCE
FERMIONS
HADRONS
INFORMATION
NUCLEONS
PHYSICAL RADIATION EFFECTS
PROTONS
RADIATION EFFECTS
SEMICONDUCTOR DEVICES
SIZE