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Solar particle induced upsets in the TDRS-1 attitude control system RAM during the October 1989 solar particle events

Journal Article · · IEEE Transactions on Nuclear Science
DOI:https://doi.org/10.1109/23.467946· OSTI ID:131648
 [1]; ;  [2];  [3]
  1. SYSCON Corp., Montrose, CA (United States)
  2. Jet Propulsion Lab., Pasadena, CA (United States)
  3. California Inst. of Tech., Pasadena, CA (United States). George W. Downs Lab. of Physics

The three large solar particle events, beginning on October 19, 1989 and lasting approximately six days, were characterized by high fluences of solar protons and heavy ions at 1 AU. During these events, an abnormally large number of upsets (243) were observed in the random access memory of the attitude control system (ACS) control processing electronics (CPE) on-board the geosynchronous TDRS-1 (Telemetry and Data Relay Satellite). The RAM unit affected was composed of eight Fairchild 93L422 memory chips. The Galileo spacecraft, launched on October 18, 1989 (one day prior to the solar particle events) observed the fluxes of heavy ions experienced by TDRS-1. Two solid-state detector telescopes on-board Galileo, designed to measure heavy ion species and energy, were turned on during time periods within each of the three separate events. The heavy ion data have been modeled and the time history of the events reconstructed to estimate heavy ion fluences. These fluences were converted to effective LET spectra after transport through the estimated shielding distribution around the TDRS-1 ACS system. The number of single event upsets (SEU) expected was calculated by integrating the measured cross section for the Fairchild 93L422 memory chip with average effective LET spectrum. The expected number of heavy ion induced SEU`s calculated was 176. GOES-7 proton data, observed during the solar particle events, were used to estimate the number of proton-induced SEU`s by integrating the proton fluence spectrum incident on the memory chips, with the two-parameter Bendel cross section for proton SEU`s. The proton fluence spectrum at the device level was gotten by transporting the protons through the estimated shielding distribution. The number of calculated proton-induced SEU`s was 72, yielding a total of 248 predicted SEU`s, very close to the 243 observed SEU`s.

OSTI ID:
131648
Journal Information:
IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 5 Vol. 42; ISSN 0018-9499; ISSN IETNAE
Country of Publication:
United States
Language:
English

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