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Single event upsets caused by solar energetic heavy ions

Journal Article · · IEEE Transactions on Nuclear Science
DOI:https://doi.org/10.1109/23.556863· OSTI ID:443046
; ;  [1];  [2];
  1. Naval Research Lab., Washington, DC (United States). E.O. Hulburt Center for Space Research
  2. Univ. of Chicago, IL (United States)

The authors calculate single event upset (SEU) rates due to protons, alphas, and heavier ions in two satellite systems for the major solar particle events of 1989--92, using a new and complete analysis of GOES proton data and high-energy heavy-ion fluences from the University of Chicago Cosmic Ray Telescope on IMP-8. These measurements cover the entire range of energies relevant to SEU studies and therefore overcome shortcomings of previous studies, which relied upon theoretical or semi-empirical estimates of high-energy heavy-ion spectra. They compare the results to the observed SEU rates in these events. The SEU rates in one device were overwhelmingly dominated by protons. However, even after taking into account uncertainties in the ground-test cross-section data, the authors find that at least {approximately}45% of the SEUs in the other device must have been caused by heavy ions. The results demonstrate that both protons and heavy ions must be considered in order to make a reliable assessment of SEU vulnerabilities. Furthermore, the GOES/Chicago database of solar particle events provides a basis for making accurate solar particle SEU calculations and credible worst-case estimates. In particular, measurements of the historic solar particle events of October 1989 are used in worst week and worst day environment models in CREME96, a revision of NRL`s Cosmic Ray Effects on MicroElectronics code.

Sponsoring Organization:
National Aeronautics and Space Administration, Washington, DC (United States); Office of Naval Research, Washington, DC (United States)
OSTI ID:
443046
Report Number(s):
CONF-960773--
Journal Information:
IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6 Vol. 43; ISSN 0018-9499; ISSN IETNAE
Country of Publication:
United States
Language:
English

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