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Development of biaxially textured buffer layers on rolled-Ni substrates for high current YBa{sub 2}Cu{sub 3}O{sub 7{minus}y} coated conductors

Conference ·
OSTI ID:442217

This paper describes the development of 3 buffer layer architectures with good biaxial textures on rolled-Ni substrates using vacuum processing techniques. The techniques include pulsed laser ablation, e-beam evaporation, dc and rf magnetron sputtering. The first buffer layer architecture consists of an epitaxial laminate of Ag/Pd(Pt)/Ni. The second buffer layer consists of an epitaxial laminate of CeO{sub 2}/Pd/Ni. The third alternative buffer layer architecture consists of an epitaxial laminate of YSZ/CeO{sub 2}/Ni. The cube (100) texture in the Ni was produced by cold rolling followed by recrystallization. Crystallographic orientations of the Pd, Ag, CeO{sub 2}, and YSZ films grown were all (100). We recently demonstrated a critical- current density of 0.73x10{sup 6} A/cm{sup 2} at 77 K and zero field on 1.4 {mu}m thick YBa{sub 2}Cu{sub 3}O{sub 7-y} (YBCO) film. This film was deposited by pulsed laser ablation on a YBCO/YSZ/CeO{sub 2}/Ni substrate.

Research Organization:
Oak Ridge National Lab., TN (United States)
Sponsoring Organization:
USDOE Office of Energy Research, Washington, DC (United States)
DOE Contract Number:
AC05-96OR22464
OSTI ID:
442217
Report Number(s):
CONF-961076--1; ON: DE97000764
Country of Publication:
United States
Language:
English

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