The effects of surface contamination on the biaxially textured substrate for YBCO thick film deposition
- ENEA Centro Ricerche Frascati, Rome (Italy)
The epitaxial growth of YBa{sub 2}Cu{sub 3}O{sub 7{minus}x} (YBCO) films on biaxially textured substrates is one of the most promising technique for the fabrication of high current superconducting tapes operating at high temperature. Ni is very attractive as substrate because it easily develops a/ (100)[001] cubic texture. The low oxidation resistance represents the main drawback of the Ni substrate. In order to better assess the role of oxygen on the Ni substrates, a surface physics technique as Auger spectroscopy has been used. It has allowed to evaluate the amount of impurities for different Ni processing and exposure to the air. The results demonstrate that the surface contamination can be efficiently removed by RF sputtering before buffer layer deposition. This procedure allows to obtain CeO{sub 2}/Pd/Ni architecture by laser ablation with a good epitaxy both of Pd and CeO{sub 2} films. On the contrary, when CeO{sub 2} is directly deposited on Ni a low epitaxy is obtained. The Auger analysis confirms that the formation of (111) NiO at the Ni-CeO{sub 2} interface hampers the epitaxial growth of the ceria film.
- OSTI ID:
- 687404
- Report Number(s):
- CONF-9810174--
- Journal Information:
- International Journal of Modern Physics B, Journal Name: International Journal of Modern Physics B Journal Issue: 9-10 Vol. 13; ISSN IJPBEV; ISSN 0217-9792
- Country of Publication:
- United States
- Language:
- English
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