Refracted x-ray fluorescence (RXF) applied to the study of thermally grown oxide scales
Conference
·
OSTI ID:436383
RXF is a new technique for studying thin films. Here, it is applied to study of thermally grown oxide scales. Evolution of chromia scales on Fe-25Cr-20Ni-0.3Y alloys and the evolution of alumina scales on {beta}-NiAl are investigated. The technique provides scale composition and depth profile information, scale thicknesses and growth rates, and information about transient phase evolution.
- Research Organization:
- Argonne National Lab., IL (United States). Materials Science Div.
- Sponsoring Organization:
- USDOE Office of Energy Research, Washington, DC (United States)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 436383
- Report Number(s):
- ANL/MSD/CP-91226; CONF-961040-14; ON: DE97001157
- Resource Relation:
- Conference: 190. meeting of the Electrochemical Society and technical exhibition, San Antonio, TX (United States), 6-11 Oct 1996; Other Information: PBD: [1996]
- Country of Publication:
- United States
- Language:
- English
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