Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Refracted x-ray fluorescence (RXF) applied to the study of thermally grown oxide scales on Fe-Cr-Ni-(RE) alloys.

Conference ·
OSTI ID:10678
Refracted X-Ray Fluorescence (RXF) is applied to the study of the thermally grown scales on Fe25Cr20Ni(RE) alloys. The evolution of chromia scales is investigated for alloys containing reactive elements (RE) Y and Zr as well as the corresponding RE-free alloy. For these alloys, scale compositions, scale thicknesses and growth rates are measured and information about concentration depth profiles is obtained.
Research Organization:
Argonne National Lab., IL (US)
Sponsoring Organization:
US Department of Energy (US)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
10678
Report Number(s):
ANL/MSD/CP-95845
Country of Publication:
United States
Language:
English

Similar Records

Refracted X-ray fluorescence (RXF) applied to the study of thin films and thermally-grown oxide scales
Journal Article · Sun Jan 31 23:00:00 EST 1999 · Oxidation of Metals · OSTI ID:335258

Refracted x-ray fluorescence (RXF) applied to the study of thermally grown oxide scales
Conference · Mon Dec 30 23:00:00 EST 1996 · OSTI ID:436383

Characterization of the scale on oxidized Fe-Ni-Cr alloys using grazing emission x-ray fluorescence.
Journal Article · Sat Sep 01 00:00:00 EDT 2001 · Physica. B, Condensed Matter · OSTI ID:943093