Refracted x-ray fluorescence (RXF) applied to the study of thermally grown oxide scales on Fe-Cr-Ni-(RE) alloys.
Conference
·
OSTI ID:10678
Refracted X-Ray Fluorescence (RXF) is applied to the study of the thermally grown scales on Fe25Cr20Ni(RE) alloys. The evolution of chromia scales is investigated for alloys containing reactive elements (RE) Y and Zr as well as the corresponding RE-free alloy. For these alloys, scale compositions, scale thicknesses and growth rates are measured and information about concentration depth profiles is obtained.
- Research Organization:
- Argonne National Lab., IL (US)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 10678
- Report Number(s):
- ANL/MSD/CP-95845; TRN: AH200127%%386
- Resource Relation:
- Conference: 193rd Electrochemical Society Meeting, San Diego, CA (US), 05/03/1998--05/08/1998; Other Information: PBD: 3 Jun 1998
- Country of Publication:
- United States
- Language:
- English
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