Refracted X-ray fluorescence (RXF) applied to the study of thin films and thermally-grown oxide scales
- Argonne National Lab., IL (United States). Materials Science Div.
Refracted X-ray fluorescence (RXF) is a relatively new technique developed for studying properties of thin films. In this paper, formalism for analysis of RXF measurements is derived from a new perspective. The technique is applied to the study of thermally grown oxide scales; model predictions are tested. The evolution of chromia scales on Fe-25Cr-20Ni-0.3Y alloys and some aspects of alumina scales grown on {beta}-NiAl are investigated. Some of the data were taken in situ, during the oxidation process. Deposited films of Fe-25Cr-20Ni-0.3Y alloys of varying thickness and the oxidation of those films were also studied. The technique is generally applicable to thin-film studies. It provides scale-composition and depth-profile information, scale thicknesses and growth rates, and information about transient-phase evolution.
- OSTI ID:
- 335258
- Journal Information:
- Oxidation of Metals, Vol. 51, Issue 1-2; Other Information: PBD: Feb 1999
- Country of Publication:
- United States
- Language:
- English
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