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MICROGRAPHIC EXAMINATION OF THE LOW-TEMPERATURE RECRYSTALLIZATION OF ALUMINUM PURIFIED BY THE ZONE-MELTING METHOD (in French)

Journal Article · · Compt. rend.
OSTI ID:4354668
The perfection of a technique for electrolytic polishing and anodic oxidation of pure Al at low temperature (--60 deg C) is demonstrated by the micrographic structure of a sample of high-purity Al recrystallized at --38 deg C after cold rolling to a 97% reduction. (tr-auth)
Research Organization:
Originating Research Org. not identified
NSA Number:
NSA-12-000299
OSTI ID:
4354668
Journal Information:
Compt. rend., Journal Name: Compt. rend. Vol. Vol: 245
Country of Publication:
Country unknown/Code not available
Language:
French

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