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Trapped space charges in electron-bombarded insulators

Journal Article · · J. Phys., D (London), v. 7, no. 3, pp. 435-442
Experimental studies were made on electron-bombarded thin insulating films of ZnS, As/sub 2/S/sub 3/, and doped CdS. Under an applied electric bias field, one of the results of bombardment in the case of the first two is in the buildup of an internal static space charge due to trapped carriers. The speed with which this charge is established and released by electron beam excitation was studied. In the case of CdS, it is found that the dominant result of bombardment is not carrier trapping, but the results lend further support to the suggestion that electron bombardment conducttvity (EBC) in doped CdS is influenced very strongly by the release of carriers already trapped. The simplified model used for volume charge storage leads to other results substantially in agreement with EBC phenomena in ZnS and As/sub 2/S/sub 3/. (auth)
Research Organization:
EMI Ltd., Hayes, Eng.
NSA Number:
NSA-29-027406
OSTI ID:
4307816
Journal Information:
J. Phys., D (London), v. 7, no. 3, pp. 435-442, Journal Name: J. Phys., D (London), v. 7, no. 3, pp. 435-442; ISSN JPDBA
Country of Publication:
United Kingdom
Language:
English