Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

EMTP modeling of IGBT dynamic performance for power dissipation estimation

Conference ·
OSTI ID:427966
 [1]
  1. Semikron Inc., Hudson, NH (United States)

A new approach to the modeling of IGBTs (Insulated Gate Bipolar Transistors) for EMTP (ElectroMagnetic Transients Program) simulation is developed. Other commercially available simulators, such a PSPICE, model the devices on an exact semiconductor physics basis. They suffer from large amount of CPU time for sinewave PWM inverter applications which require a complete cycle simulation at fundamental frequency with a small time step to cover the details of IGBT switching transients. This approach uses a curve-fitting method, combined with the point-by-point user-defined function available in EMTP, to model the dynamic characteristics of IGBTs. Since there is no device physics modeling required, the simulation is much faster than the conventional approach. The proposed method is applicable for both static and dynamic modeling, on a cycle-by-cycle basis, which is important for dynamical power dissipation and thermal analysis. The simulation includes IGBT turn-on and turn-off transients, IGBT saturation, free-wheeling diode forward voltage and reverse recovery characteristics. The simulation results are verified by comparison with the experimental measured data. Measurements show a close agreement with simulations.

OSTI ID:
427966
Report Number(s):
CONF-9510203--
Country of Publication:
United States
Language:
English

Similar Records

Study of dose effects on IGBT-type devices subjected to gamma irradiation
Journal Article · Tue Nov 30 23:00:00 EST 1999 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers) · OSTI ID:20014727

Characterization and modeling of the power Insulated Gate Bipolar Transistor
Thesis/Dissertation · Wed Dec 31 23:00:00 EST 1986 · OSTI ID:7074389

A Datasheet Driven Unified Si/SiC Compact IGBT Model for N-Channel and P-Channel Devices
Journal Article · Thu Dec 20 23:00:00 EST 2018 · IEEE Transactions on Power Electronics · OSTI ID:1557400