Radiation testing of an 8-bit CMOS microprocessor
Journal Article
·
· IEEE Trans. Nucl. Sci., v. NS-22, no. 5, p. 2120
OSTI ID:4192069
An 8-bit CMOS microprocessor has been tested in an ionizing radiation environment. Quiescent current was monitored during the irradiation and clock frequency was a test parameter. Irradiated in a static condition, failure was observed at a total dose of 3 x 10$sup 4$ rads (Si). (auth)
- Research Organization:
- Naval Research Lab., Washington, DC
- NSA Number:
- NSA-33-000804
- OSTI ID:
- 4192069
- Journal Information:
- IEEE Trans. Nucl. Sci., v. NS-22, no. 5, p. 2120, Journal Name: IEEE Trans. Nucl. Sci., v. NS-22, no. 5, p. 2120; ISSN IETNA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
*INTEGRATED CIRCUITS-- PHYSICAL RADIATION EFFECTS
*MOS TRANSISTORS-- PHYSICAL RADIATION EFFECTS
440200* --Instrumentation--Radiation Effects on Instrument Components
Instruments
or Electronic Systems
FAILURES
N46300* --Instrumentation--Radiation Effects on Instrument Components
Instruments
or Electronic Systems
TESTING
*MOS TRANSISTORS-- PHYSICAL RADIATION EFFECTS
440200* --Instrumentation--Radiation Effects on Instrument Components
Instruments
or Electronic Systems
FAILURES
N46300* --Instrumentation--Radiation Effects on Instrument Components
Instruments
or Electronic Systems
TESTING