THE DEVELOPMENT OF THE JUNCTION DETECTOR

Journal Article · Wed Jun 01 00:00:00 EDT 1960 · IRE Trans. Nuclear Sci.

DOI:https://doi.org/10.1109/TNS2.1960.4315760· OSTI ID:4143448

Mayer, J W

The use of semiconductor devices as alpha spectrometers was first demonstrated on gold-germanium surface-barrier diodes. Investigations were made to determine the capability of silicon junctions, both surface-barrier and shallow-diffused, to perform as charged-particle spectrometers. Small shallow- diffused units were made with good resolution and wide depletion regions, but there was evidence of a thin window on the front surface. Large surface barrier units were made with good resolution and no window effect, but they had only relatively narrow depletion regions. (M.C.G.)

• Research Organization: Hughes Aircraft Co., Los Angeles
• Sponsoring Organization: USDOE
• NSA Number: NSA-14-025716
• OSTI ID: 4143448
• Journal Information: IRE Trans. Nuclear Sci., Journal Name: IRE Trans. Nuclear Sci. Vol. Vol: NS-7, No. 2-3
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

ALPHA SPECTROMETERS
CHARGED PARTICLES
DIODES
EFFICIENCY
ENGINEERING AND EQUIPMENT
GERMANIUM
GOLD
RESOLUTION
SEMICONDUCTORS
SILICON
SURFACES
WINDOWS