Effect of Crystal Thickness and Geometry on the Alpha-Particle Resolution of CsI (Tl)

Journal Article · Thu Sep 01 04:00:00 EDT 1960 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1717121· OSTI ID:4113404

Martinez, Prudencio; Senftle, Frank E.

The resolution of CsI(Tl) for Po/sup 210/ alpha particles was measured as a function of crystal thickness. The best resolution of a 0.5-in.-diameter cylindrical crystal was obtained for a thickness of 0.38 mm, and the effect of thickness on the resolution is discussed. Based on the proposed model, a conical crystal was designed which yielded a line width of 1.8% for Po/sup 210/ alpha particles with a selected photomultiplier tube.(auth)

• Research Organization: U.S. Geological Survey, Washington, D.C.
• Sponsoring Organization: USDOE
• NSA Number: NSA-15-004133
• OSTI ID: 4113404
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 9 Vol. 31; ISSN 0034-6748; ISSN RSINAK
• Publisher: American Institute of Physics (AIP)
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

ALPHA PARTICLES
CRYSTALS
ENGINEERING AND EQUIPMENT
MEASURED VALUES
PHOTOMULTIPLIERS
THICKNESS