Investigation of an electron beam ion source for the production of multiply charged heavy ions

Conference · Wed Mar 31 23:00:00 EST 1976 · IEEE Trans. Nucl. Sci., v. NS-23, no. 2, pp. 1027-1030

OSTI ID:4038522

Clausnitzer, G; Klinger, H; Mueller, A; Salzborn, E

An electron beam ion source for the production of multiply charged heavy ions was developed. Dc ion beams of neon, argon, krypton, and xenon ions were produced. Xenon beam currents are in the range from some 10$sup -9$A for Xe$sup 10+$ up to about 10$sup -6$A for charge states lower than Xe$sup 4+$. The ion source proved to be very reliable and simple to operate. The analyzed charge spectra are compared with a theoretical model which allows for computation of the ion charge distribution in dependence on various source parameters.

• Research Organization: Univ., Giessen, Ger.
• NSA Number: NSA-33-030443
• OSTI ID: 4038522
• Journal Information: IEEE Trans. Nucl. Sci., v. NS-23, no. 2, pp. 1027-1030, Journal Name: IEEE Trans. Nucl. Sci., v. NS-23, no. 2, pp. 1027-1030; ISSN IETNA
• Country of Publication: United States
• Language: English

Related Subjects

*ACCELERATORS-- ELECTRON BEAM ION SOURCES
*ELECTRON BEAM ION SOURCES- - PERFORMANCE TESTING
430301* --Particle Accelerators--Auxiliaries & Components-- Ion Sources
ARGON
BEAM CURRENTS
BEAM PRODUCTION
HEAVY IONS
KRYPTON
MATHEMATICAL MODELS
N54300* --Particle Accelerators--Ion Sources
Injection & Extraction
NEON
OPERATION
RELIABILITY
SPECTRA
XENON