DETERMINATION OF MICRO RHODIUM FILM THICKNESS AND OF GOLD PLATING THICKNESS ON PRINTED CIRCUITS BY BETA RADIATION BACKSCATTER MEASUREMENTS

Journal Article · Tue Aug 01 04:00:00 EDT 1961 · Analytical Chemistry (U.S.) Formerly Ind. Eng. Chem., Anal. Ed.

DOI:https://doi.org/10.1021/ac60177a035· OSTI ID:4023259

Eggebraaten, V L; Walker, L J; Strobelt, E W

Beta radiation backscatter techniques were applied to thickness measurements of gold plating on printed circuit cards and of very thin rhodium films vaporized on a sapphire crystalline base. Gold thicknesses between 100 to 500 mu cm were determined with an accuracy of 18 mu cm. Rhodium film thickness was measured from 0.5 to 5 mu cm with an accuracy of 0.5 mu cm. The method of analysis described is nondestructive and is designed to give sensitive and reliable results. (auth)

• Research Organization: Boeing Airplane Co., Seattle
• Sponsoring Organization: USDOE
• NSA Number: NSA-15-024820
• OSTI ID: 4023259
• Journal Information: Analytical Chemistry (U.S.) Formerly Ind. Eng. Chem., Anal. Ed., Journal Name: Analytical Chemistry (U.S.) Formerly Ind. Eng. Chem., Anal. Ed. Vol. Vol: 33; ISSN ANCHA
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

BETA PARTICLES
CHEMISTRY
CIRCUITS
FILMS
GOLD
MEASURED VALUES
PLATING
QUANTITATIVE ANALYSIS
RADIATIONS
REFLECTION
RHODIUM
SCATTERING
THICKNESS