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Card controlled beta backscatter thickness measuring instrument

Patent ·
OSTI ID:6936733
An improved beta backscatter instrument for the nondestructive measurement of the thickness of thin coatings on a substrate is described. Included therein is the utilization of a bank of memory stored data representative of isotope, substrate, coating material and thickness range characteristics in association with a control card having predetermined indicia thereon selectively representative of a particular isotope, substrate material, coating material and thickness range for conditioning electronic circuit means by memory stored data selected in accord with the predetermined indicia on a control card for converting backscattered beta particle counts into indicia of coating thickness.
Assignee:
Unit Process Assemblies, Inc.
Patent Number(s):
US 4079237
OSTI ID:
6936733
Country of Publication:
United States
Language:
English

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Related Subjects

440105* -- Radiation Instrumentation-- Radiometric Instruments-- (-1987)
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BACKSCATTERING
BETA PARTICLES
CHARGED PARTICLES
COATINGS
CONTROL SYSTEMS
DESIGN
DIMENSIONS
MEASURING INSTRUMENTS
RADIOMETRIC GAGES
SCATTERING
THICKNESS
THICKNESS GAGES