X-ray analysis of spontaneous lateral modulation in (InAs){sub n}/(AlAs){sub m} short-period superlattices

Journal Article · Sun Jan 07 23:00:00 EST 2001 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.1338499· OSTI ID:40205261

Li, J H; Holy, V; Zhong, Z; Kulik, J; Moss, S C; Norman, A G; Mascarenhas, A; Reno, J L; Follstaedt, D M

The lateral composition modulation in (InAs){sub n}/(AlAs){sub m} short-period superlattices was studied by means of synchrotron x-ray diffraction. By choosing specific diffraction vectors having a large component closely parallel to the modulation direction, we are able to observe a number of lateral satellite peaks around the zero-order short-period superlattice peak. A model, incorporating both composition and strain, is used to simulate the intensities of these satellites. Our results provide a quantitative fit and permit the evaluation of the composition amplitude.

• Sponsoring Organization: (US)
• OSTI ID: 40205261
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 2 Vol. 78; ISSN 0003-6951
• Publisher: The American Physical Society
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
DIFFRACTION
EVALUATION
MODULATION
PHYSICS
SATELLITES
SUPERLATTICES
SYNCHROTRONS
VECTORS
X-RAY DIFFRACTION