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Strain-dependent morphology of spontaneous lateral composition modulations in (AlAs){sub m}(InAs){sub n} short-period superlattices grown by molecular beam epitaxy

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.122301· OSTI ID:659289
; ; ; ;  [1]; ; ; ; ; ;  [2]
  1. National Renewable Energy Laboratory, 1617 Cole Boulevard, Golden, Colorado 80401 (United States)
  2. Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)

The nature of spontaneous lateral composition modulation and its relationship to surface morphology during the growth of (AlAs){sub m}(InAs){sub n} short-period superlattices by molecular beam epitaxy are investigated as a function of the global strain between the short-period superlattice and (001)InP substrate. For samples grown under tension, transmission electron and atomic force microscopy reveal composition modulations along directions close to {l_angle}310{r_angle} coupled to a surface cusping. For samples grown under compression, we observe composition modulations roughly along the elastically soft {l_angle}100{r_angle} directions coupled to a surface rippling. For high strains ({ge}0.7{percent}), with individual InAs layer thicknesses {le}1.6 monolayers, we observe weak or no composition modulations. {copyright} {ital 1998 American Institute of Physics.}

OSTI ID:
659289
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 13 Vol. 73; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English