Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Application of optical filters fabricated by masked ion beam lithography

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena
DOI:https://doi.org/10.1116/1.588691· OSTI ID:399793
; ;  [1]; ;  [2];  [3]
  1. EDTEK, Inc., Kent, Washington 98032 (United States)
  2. University of Houston, Houston, Texas 77204 (United States)
  3. Cornell Nanofabrication Facility, Cornell University, Ithaca, New York 14853 (United States)
Masked ion beam lithography (MIBL) was employed to fabricate optical filters as a critical component of an energy conversion system which utilizes semiconductor photovoltaics. This article will describe the operation and novel application of these devices and the MIBL pilot production line being facilitized. The conversion concept, thermophotovoltaics (TPV), when coupled with these MIBL produced bandpass filters, is capable of converting heat to electrical power with {gt}20{percent} conversion efficiency. The EDTEK TPV filter is based on a high density array of slotted antenna elements patterned into a single layer of thin gold film. {copyright} {ital 1996 American Vacuum Society}
OSTI ID:
399793
Report Number(s):
CONF-960582--
Journal Information:
Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena, Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena Journal Issue: 6 Vol. 14; ISSN JVTBD9; ISSN 0734-211X
Country of Publication:
United States
Language:
English

Similar Records

IR filters for TPV converter modules
Journal Article · Thu Feb 29 23:00:00 EST 1996 · AIP Conference Proceedings · OSTI ID:385452

Prospects for printing very-large-scale integrated circuits with masked ion-beam lithography
Technical Report · Sun Jun 01 00:00:00 EDT 1986 · OSTI ID:5100423

Fabrication of metal{endash}oxide{endash}semiconductor devices with extreme ultraviolet lithography
Journal Article · Thu Oct 31 23:00:00 EST 1996 · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena · OSTI ID:402323