Oxide superconductor interfaces studied by spectroscopic ellipsometry
Book
·
OSTI ID:392177
- Pennsylvania State Univ., University Park, PA (United States). Dept. of Materials Science and Engineering
- Duke Univ., Durham, NC (United States). Dept. of Mechanical Engineering and Materials Science
In the eight years since its discovery, numerous materials have been identified as being compatible with YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} (YBCO). Investigation of potentially compatible compounds requires a knowledge of both the chemistry and microstructure of the interface between the superconductor and the material. In this work, spectroscopic ellipsometry (SE) is being developed as a rapid and nondestructive characterization tool for investigating these interfaces. In addition, SE was used to determine reference optical data for common YBCO substrate materials. These include BaZrO{sub 3}, 9.5 mol% Y{sub 2}O{sub 3}-ZrO{sub 2} (YSZ), NdGaO{sub 3} and LaSrGaO{sub 4}. SE measurements of epitaxial YBCO on YSZ substrates have shown that it is possible to identify the formation of the known BaZrO{sub 3} reaction layer. The modeled thickness of the reaction layer, as well as the modeled thickness of the YBCO film, are as expected. SE measurements as a function of temperature for YBCO/SrTiO{sub 3} have also been obtained. The SE data shows dramatic changes from room temperature to high temperature. This is due to the strong dependence of the dielectric function of YBCO on the oxygen content of the film.
- OSTI ID:
- 392177
- Report Number(s):
- CONF-951155--; ISBN 1-55899-304-5
- Country of Publication:
- United States
- Language:
- English
Similar Records
Crystallography of YBa sub 2 Cu sub 3 O sub 6+ x thin film--substrate interfaces
Interfacial reaction products and film orientation in YBa[sub 2]Cu[sub 3]O[sub 7[minus][ital x]] on zirconia substrates with and without CeO[sub 2] buffer layers
Amorphization evidence from kinetic ellipsometry in monolayer-controlled deposition of rf sputtered YBaCuO compounds
Journal Article
·
Fri Sep 01 00:00:00 EDT 1989
· Journal of Materials Research; (USA)
·
OSTI ID:5420716
Interfacial reaction products and film orientation in YBa[sub 2]Cu[sub 3]O[sub 7[minus][ital x]] on zirconia substrates with and without CeO[sub 2] buffer layers
Journal Article
·
Sun Oct 31 23:00:00 EST 1993
· Journal of Materials Research; (United States)
·
OSTI ID:5774660
Amorphization evidence from kinetic ellipsometry in monolayer-controlled deposition of rf sputtered YBaCuO compounds
Conference
·
Wed Feb 24 23:00:00 EST 1988
· AIP Conf. Proc.; (United States)
·
OSTI ID:6957470
Related Subjects
36 MATERIALS SCIENCE
BARIUM OXIDES
CHEMICAL REACTIONS
COMPATIBILITY
COMPOSITE MATERIALS
COPPER OXIDES
ELLIPSOMETRY
ENERGY BEAM DEPOSITION
EXPERIMENTAL DATA
GALLIUM OXIDES
INTERFACES
LANTHANUM OXIDES
LASERS
NEODYMIUM OXIDES
SPUTTERING
STRONTIUM OXIDES
STRONTIUM TITANATES
SUPERCONDUCTIVITY
X-RAY DIFFRACTION
YTTRIUM OXIDES
ZIRCONIUM OXIDES
BARIUM OXIDES
CHEMICAL REACTIONS
COMPATIBILITY
COMPOSITE MATERIALS
COPPER OXIDES
ELLIPSOMETRY
ENERGY BEAM DEPOSITION
EXPERIMENTAL DATA
GALLIUM OXIDES
INTERFACES
LANTHANUM OXIDES
LASERS
NEODYMIUM OXIDES
SPUTTERING
STRONTIUM OXIDES
STRONTIUM TITANATES
SUPERCONDUCTIVITY
X-RAY DIFFRACTION
YTTRIUM OXIDES
ZIRCONIUM OXIDES