Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Crystallography of YBa sub 2 Cu sub 3 O sub 6+ x thin film--substrate interfaces

Journal Article · · Journal of Materials Research; (USA)
;  [1]; ; ;  [2];  [3]
  1. Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853 (US)
  2. School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853
  3. Homer Research Laboratory, Bethlehem Steel Corporation, Bethlehem, Pennsylvania 18016
The epitactic nature of the growth of YBa{sub 2}Cu{sub 3}O{sub 6+{ital x}} (YBCO) superconducting thin films on ceramic substrates has been studied using high-resolution electron microscopy (HREM) and selected-area diffraction (SAD) of cross-sectional specimens. The films were grown {ital in} {ital situ} on (001)-oriented MgO and (001)-oriented Y{sub 2}O{sub 3}-stabilized cubic ZrO{sub 2} (YSZ) single-crystal substrates by electron beam evaporation. Both of these materials have large lattice misfits with respect to YBCO. Different orientation relationships were observed for films grown on the two types of substrates. These orientation relationships are shown to provide the best matching of the oxygen sublattices across the substrate-film interfaces. A crystalline intermediate layer, 6 nm thick, between the YBCO film and YSZ substrate was observed by HREM and shown by EDS to be a Ba-enriched phase, possibly barium zirconate formed by a reaction. In contrast, the YBCO--MgO interface was found to be sharp and free of any intermediate layers.
OSTI ID:
5420716
Journal Information:
Journal of Materials Research; (USA), Journal Name: Journal of Materials Research; (USA) Vol. 4:5; ISSN JMREE; ISSN 0884-2914
Country of Publication:
United States
Language:
English