Orientation of YBa[sub 2]Cu[sub 3]O[sub 7[minus][ital x]] films on unbuffered and CeO[sub 2]-buffered yttria-stabilized zirconia substrates

Journal Article · Sat Oct 15 00:00:00 EDT 1994 · Journal of Applied Physics; (United States)

DOI:https://doi.org/10.1063/1.357245· OSTI ID:7229340

Skofronick, G L; Carim, A H ^[1]; Foltyn, S R; Muenchausen, R E ^[2]

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1. Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802 (United States)
2. Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)

YBa[sub 2]Cu[sub 3]O[sub 7[minus][ital x]] (YBCO) films deposited by pulsed laser ablation on unbuffered and CeO[sub 2]-buffered yttria-stabilized zirconia (YSZ) substrates were studied by x-ray diffraction and transmission electron microscopy to investigate film orientation. From [phi] scans it was determined that the unbuffered films possess two major in-plane orientation relationships with the substrate. Both have (001)[sub YBCO][parallel](001)[sub YSZ], with either [100][sub YBCO][parallel][100][sub YSZ] or [110][sub YBCO][parallel][100][sub YSZ], a 0[degree] or 45[degree] orientation, respectively. As deposition temperature increases, satellite peaks that straddle the 0[degree] or 45[degree] orientations develop. The [Sigma] boundary and near coincident site lattice descriptions are applied to the discussion of these misorientations. In general the CeO[sub 2]-buffered YBCO films align with to the 45[degree] orientation to the CeO[sub 2] buffer layer. Out-of-plane film orientation was investigated for both unbuffered and CeO[sub 2]-buffered YBCO films and expressed as a ratio of the amount of [ital c][perpendicular] material to [ital a][perpendicular] material. Buffered films exhibited [ital c][perpendicular] material to [ital a][perpendicular] material ratios approximately twice those of unbuffered films. Transmission electron microscopy combined with the x-ray data was used to develop an explanation for the trends in the variation of the [ital c][perpendicular]/[ital a][perpendicular] ratio with film deposition temperature.

• OSTI ID: 7229340
• Journal Information: Journal of Applied Physics; (United States), Journal Name: Journal of Applied Physics; (United States) Vol. 76:8; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
ABLATION
ALKALINE EARTH METAL COMPOUNDS
BARIUM COMPOUNDS
BARIUM OXIDES
CERIUM COMPOUNDS
CERIUM OXIDES
CHALCOGENIDES
COHERENT SCATTERING
COPPER COMPOUNDS
COPPER OXIDES
DIFFRACTION
ELECTROMAGNETIC RADIATION
ELECTRON MICROSCOPY
FILMS
HIGH-TC SUPERCONDUCTORS
LASER RADIATION
MICROSCOPY
ORIENTATION
OXIDES
OXYGEN COMPOUNDS
RADIATIONS
RARE EARTH COMPOUNDS
SCATTERING
SUPERCONDUCTING FILMS
SUPERCONDUCTORS
TRANSITION ELEMENT COMPOUNDS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION
YTTRIUM COMPOUNDS
YTTRIUM OXIDES
ZIRCONIUM COMPOUNDS