Alternative Methods for Sub-eV Resolution Inelastic X-ray Scattering
- Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States)
- AT&T Bell Laboratories, Murray Hill, NJ 07974 (United States)
A synopsis of SRI workshop 9 held on October 20, 1995, is given. Details concerning the oral presentations of speakers not contributing to these proceedings are included. The workshop consisted of the following invited presentations: 1. M. Schwoerer-Boehning (APS), {open_quote}{open_quote}Experimental Needs for Milli-eV Resolution Inelastic X-ray Scattering, {close_quote}{close_quote} 2. E. E. Alp (APS), {open_quote}{open_quote}Inelastic Nuclear Resonant X-ray Scattering,{close_quote}{close_quote} 3. A. Baron (ESRF), {open_quote}{open_quote} Inelastic X-ray Scattering via Nuclear Resonant Analyzer,{close_quote}{close_quote} 4. D. E. Moncton (APS), {open_quote}{open_quote} An Exact Backscattering Beamline,{close_quote}{close_quote} 5. A. Caticha (SUNY-Albany), {open_quote}{open_quote}X-ray Fabry-Perot Cavities,{close_quote}{close_quote} 6. E. D. Isaacs (AT&T Bell Labs), {open_quote}{open_quote}Flux and Resolution Requirements for Studies of Electronic Excitations in Solids,{close_quote}{close_quote} 7. C. K. Stahle (NASA), {open_quote}{open_quote}Hard X-ray Detectors with Very High Energy Resolution,{close_quote}{close_quote} 8. A. K. Freund (ESRF), {open_quote}{open_quote}Mosaic Crystal Analyzers.{close_quote}{close_quote} These proceedings contain separate papers by Caticha, Isaacs, and Stahle for the above listed presentations, and we will not discuss them further here. The other presentations are summarized below. {copyright} {ital 1996 American Institute of Physics.}
- OSTI ID:
- 390343
- Report Number(s):
- CONF-9510119-; ISSN 0034-6748; TRN: 96:028071
- Journal Information:
- Review of Scientific Instruments, Vol. 67, Issue 9; Conference: SRI `95: synchrotron radiation instrumentation symposium and the 7. users meeting for the advanced photon source (APS), Argonne, IL (United States), 16-20 Oct 1995; Other Information: PBD: Sep 1996
- Country of Publication:
- United States
- Language:
- English
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