Inelastic x-ray scattering including resonance phenomena
- Department of Physics, POB 9, FIN-00014 University of Helsinki (Finland)
- NSLS, Brookhaven National Laboratory, Upton, New York 11973 (United States)
The availability of intense synchrotron sources has recently made it possible to study weak interaction phenomena using inelastic x-ray scattering utilizing high resolution crystal spectrometers. The total resolution {Delta}E/E of the order of 10{sup {minus}4} (better than 1 eV at 8 keV) is rather easily achievable using backscattering geometry and the measured count rates, especially from the low-Z elements, have turned out to be reasonable. Moreover, the tunability of the incident energy makes it possible to study the resonance phenomena while scanning the incident photon energy in the vicinity of these intrinsic resonances. One of the breakthroughs has been the possibility to measure the evolution of fluorescence radiation through an absorption edge and get 2-dimensional information which reveals fine structures which are normally washed out by the core-hole lifetime. In this paper we will review several examples of resonant- and non-resonant inelastic x-ray scattering experiments accomplished at NSLS and ESRF. These include Fermi-surface studies using Compton scattering, magnetic Compton scattering, high resolution fluorescence and absorption spectroscopy including site- and local-spin selectivity. {copyright} {ital 1997 American Institute of Physics.}
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC02-76CH00016
- OSTI ID:
- 587197
- Report Number(s):
- CONF-9609283-; ISSN 0094-243X; TRN: 98:004276
- Journal Information:
- AIP Conference Proceedings, Vol. 389, Issue 1; Conference: 17. international conference on x-ray and inner shell processes, Hamburg (Germany), 9-13 Sep 1996; Other Information: PBD: Jan 1997
- Country of Publication:
- United States
- Language:
- English
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