JCPDS-international centre for diffraction data low-angle powder diffraction study of silver behenate

Journal Article · Sun Dec 31 04:00:00 EST 1995 · Advances in X-Ray Analysis

DOI:https://doi.org/10.1007/978-1-4615-1797-9_11· OSTI ID:369805

Blanton, T; Huang, T; Toraya, H; Hubbard, C ^[1]

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1. and others

As a result of interest in the characterization of materials with large d-spacings and layer periodicities, it has become necessary to develop a low-angle diffraction material which has well-defined diffraction peaks down to very small 2{theta} angles. The use of silver behenate, CH{sub 3}(CH{sub 2}){sub 20}COO-Ag, was introduced by one of the authors (TB) at the 1991 International Center for Diffraction Data (ICDD) Annual Meeting and was shown to have a set of well-defined (00l) diffraction peaks down to 1.5{degrees} 2{theta} when using CuK{alpha} radiation. The silver behenate diffraction peaks were observed to be slightly asymmetric with relatively long tails at the low angle side of the peaks. The average crystallite size along the c-axis was estimated using the Scherrer equation and was found to be 900 {Angstrom}. A task group of the JCPDS-ICDD Data Collection and Analysis Subcommittee was established with the charge of investigating the use of silver behenate as a possible low-angle calibration material for diffraction applications. Utilizing several data collection and data analysis techniques, d{sub 001} long-period spacings in the range of 58.219-58.480 {Angstrom} were obtained. Using the same collected data and one data analysis, refinement calculation method resulted in long-period spacings with a range of 58.303-58.425 {Angstrom}. Data collected using a silicon internal standard and the same singular data analysis calculation method provided d{sub 001} values with a range of 58.363-58.381 {Angstrom}. The formation of a full-range 2{theta} diffraction sample was also investigated. Silver behenate and inorganic powders were mixed with an epoxy binder to form a permanent sample which provides diffraction peaks over the entire 2{theta} range of a powder diffractometer. 8 refs., 3 figs., 1 tab.

• Sponsoring Organization: USDOE
• OSTI ID: 369805
• Report Number(s): CONF-9408178--
• Journal Information: Advances in X-Ray Analysis, Journal Name: Advances in X-Ray Analysis Vol. 38; ISSN AXRAAA; ISSN 0376-0308
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
66 PHYSICS
CRYSTAL STRUCTURE
SILVER COMPOUNDS
X-RAY DIFFRACTION