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Modeling of gettering of precipitated impurities from Si for carrier lifetime improvement in solar cell applications

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.371075· OSTI ID:362667
; ; ;  [1]
  1. Department of Mechanical Engineering and Materials Science, Duke University, Durham, North Carolina 27708-0300 (United States)

Physical and numerical modeling of impurity gettering from multicrystalline Si for solar cell production has been carried out using Fe as a model impurity. Calculated change of nonradiative recombination coefficient of minority carriers in the course of gettering is used as a tool for evaluating the gettering efficiency. A derivation of the capture cross section of impurity precipitates, as compared to single atom recombination centers, is presented. Low efficiency of the conventional application of the gettering process is explained by the modeling results. The variable temperature gettering process is modeled and predicted to provide high gettering efficiency and short needed gettering times. {copyright} {ital 1999 American Institute of Physics.}

OSTI ID:
362667
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 5 Vol. 86; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English

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