Anatomy of an in-flight anomaly: Investigation of proton-induced SEE test results for stacked IBM DRAMs

Journal Article · Mon Nov 30 23:00:00 EST 1998 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/23.736545· OSTI ID:323972

LaBel, K A; Barth, J L; Katz, R B; Reed, R A; Leidecker, H W ^[1]; Marshall, P W ^[2]; Kim, H S ^[3]; Marshall, C J ^[4]

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1. NASA/Goddard Space Flight Center, Greenbelt, MD (United States)
2. Marshall (P.W.), Brookneal, VA (United States)
3. Jackson and Tull Chartered Engineers, Seabrook, MD (United States)
4. NRL, Washington, DC (United States)

The authors present ground test and space flight data describing a single event anomaly that affects multiple bytes in a stacked DRAM module. A 12 Gbit solid state recorder containing 1,440 DRAM die experiences the anomalous events at a rate requiring testing of a large sample set of these modules.

• OSTI ID: 323972
• Report Number(s): CONF-980705--
• Journal Information: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6Pt1 Vol. 45; ISSN 0018-9499; ISSN IETNAE
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
ERRORS
LET
MEMORY DEVICES
PHYSICAL RADIATION EFFECTS
RECORDING SYSTEMS
SPACE FLIGHT