The effect of elastic strain on the electrical and magnetic properties of epitaxial ferromagnetic SrRuO{sub 3} thin films
- Duke Univ., Durham, NC (United States). Dept. of Mechanical Engineering and Materials Science
- Univ. of Virginia, Charlottesville, VA (United States). Dept. of Physics
The authors report the direct measurement of elastic strain effect on the electrical and magnetic properties of single domain epitaxial SrRuO{sub 3} thin films, using a lift-off technique. The as-grown films on vicinal (001) SrTiO{sub 3} substrates are subjected to elastic biaxial compressive strain within the plane and tensile strain normal to the plane. In contrast, the lift-off films prepared by chemical etching of SrTiO{sub 3} substrates, are completely strain free with bulk like lattice. The measurements indicate that the elastic strain can significantly affect the electrical and magnetic properties of epitaxial ferromagnetic SrRuO{sub 3} thin films. For the strained films, the Curie temperature ({Tc}) was suppressed to 150 K and the saturation magnetic moment (M{sub s}) was decreased to 1.15 {micro}{sub B}/Ru atom as compared to a {Tc} of 160 K and M{sub S} of 1.45 {micro}{sub B}/Ru atom for the strain free films. These property changes are attributed to the structural distortion due to the elastic strain in the as-grown epitaxial thin films. The results provide direct evidence of the crucial role of lattice strain in determining the properties of the perovskite epitaxial thin films.
- Sponsoring Organization:
- Office of Naval Research, Washington, DC (United States); National Science Foundation, Washington, DC (United States)
- OSTI ID:
- 323422
- Report Number(s):
- CONF-971201--; ISBN 1-55899-399-1
- Country of Publication:
- United States
- Language:
- English
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