Simple method for estimating neutron-induced soft error rates based on modified BGR model

Journal Article · Sun Jan 31 23:00:00 EST 1999 · IEEE Electron Device Letters

DOI:https://doi.org/10.1109/55.740661· OSTI ID:320998

Tosaka, Y; Kanata, H; Satoh, S; Itakura, T ^[1]

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1. Fujitsu Labs. Ltd., Atsugi (Japan)

Recently the importance of cosmic ray neutron-induced soft errors has been recognized. The authors propose a simple model to estimate the neutron-induced soft error rates (SER`s), which is a modified version of the burst generation rate (BGR) model. The model can be used to easily and quickly estimate neutron-induced soft error rates and provides a useful guideline for device and circuit engineers to estimate neutron-induced soft errors (SE`s).

• OSTI ID: 320998
• Journal Information: IEEE Electron Device Letters, Journal Name: IEEE Electron Device Letters Journal Issue: 2 Vol. 20; ISSN 0741-3106; ISSN EDLEDZ
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
ERRORS
LOGIC CIRCUITS
MATHEMATICAL MODELS
NEUTRONS
PHYSICAL RADIATION EFFECTS
SPACE FLIGHT