Performance status of 0.55 eV InGaAs thermophotovoltaic cells
Conference
·
OSTI ID:307871
- Spire Corp., Bedford, MA (United States)
- Lockheed Martin Inc., Schenectady, NY (United States)
Data on {approximately} 0.55 eV In{sub 0.72}Ga{sub 0.28}As cells with an average open-circuit voltage (Voc) of 298 mV (standard deviation 7 mV) at an average short-circuit current density of 1.16 A/cm{sup 2} (sdev. 0.1 A/cm{sup 2}) and an average fill-factor of 61.6% (sdev. 2.8%) is reported. The absorption coefficient of In{sub 0.72}Ga{sub 0.28}As was measured by a differential transmission technique. The authors use a numerical integration of the absorption data to determine the radiative recombination coefficient for In{sub 0.72}Ga{sub 0.28}As. Using this absorption data and simple one-dimensional analytical formula the above cells are modeled. The models show that the cells may be limited more by Auger recombination rather than Shockley-Read-Hall (SRH) recombination at dislocation centers caused by the 1.3% lattice mismatch of the cell to the host InP wafer.
- Research Organization:
- Knolls Atomic Power Lab., Schenectady, NY (United States)
- Sponsoring Organization:
- USDOE Assistant Secretary for Nuclear Energy, Washington, DC (United States)
- DOE Contract Number:
- AC12-76SN00052
- OSTI ID:
- 307871
- Report Number(s):
- KAPL-P--000121; K--98163; CONF-981055--; ON: DE99001609
- Country of Publication:
- United States
- Language:
- English
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