Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Selected Lifetime and Oscillator Strength Measurements in Si ii

Journal Article · · Astrophysical Journal
DOI:https://doi.org/10.1086/306120· OSTI ID:292700
; ;  [1]
  1. Department of Physics and Astronomy, University of Toledo, Toledo, OH 43606 (United States)
We have remeasured the lifetimes of the 3{ital s}{sup 2}4{ital s} and 3{ital s}{sup 2}5{ital s}thinsp{sup 2}{ital S}{sub 1/2} levels in Si ii using beam foil spectroscopic techniques. Measured values for the lifetimes and oscillator strengths derived from them are presented and compared with previous measurements and theoretical calculations. Agreement with recent theoretical calculations is now quite good: for 3{ital s}{sup 2}4{ital s} it is excellent and for 3{ital s}{sup 2}5{ital s} it is satisfactory, although the theoretical uncertainties in that calculation are still somewhat larger than desired. {copyright} {ital {copyright} 1998.} {ital The American Astronomical Society}
OSTI ID:
292700
Journal Information:
Astrophysical Journal, Journal Name: Astrophysical Journal Journal Issue: 2 Vol. 504; ISSN ASJOAB; ISSN 0004-637X
Country of Publication:
United States
Language:
English